In mathematics , Laplace's principle is a basic theorem in large deviations theory which is similar to Varadhan's lemma . It gives an asymptotic expression for the Lebesgue integral of exp(−θφ (x )) over a fixed set A as θ becomes large. Such expressions can be used, for example, in statistical mechanics to determining the limiting behaviour of a system as the temperature tends to absolute zero .
Statement of the result [ edit ]
Let A be a Lebesgue-measurable subset of d -dimensional Euclidean space R d and let φ : R d → R be a measurable function with
∫
A
e
−
φ
(
x
)
d
x
<
∞
.
{\displaystyle \int _{A}e^{-\varphi (x)}\,dx<\infty .}
Then
lim
θ
→
∞
1
θ
log
∫
A
e
−
θ
φ
(
x
)
d
x
=
−
e
s
s
i
n
f
x
∈
A
φ
(
x
)
,
{\displaystyle \lim _{\theta \to \infty }{\frac {1}{\theta }}\log \int _{A}e^{-\theta \varphi (x)}\,dx=-\mathop {\mathrm {ess\,inf} } _{x\in A}\varphi (x),}
where ess inf denotes the essential infimum . Heuristically, this may be read as saying that for large θ ,
∫
A
e
−
θ
φ
(
x
)
d
x
≈
exp
(
−
θ
e
s
s
i
n
f
x
∈
A
φ
(
x
)
)
.
{\displaystyle \int _{A}e^{-\theta \varphi (x)}\,dx\approx \exp \left(-\theta \mathop {\mathrm {ess\,inf} } _{x\in A}\varphi (x)\right).}
The Laplace principle can be applied to the family of probability measures P θ given by
P
θ
(
A
)
=
(
∫
A
e
−
θ
φ
(
x
)
d
x
)
/
(
∫
R
d
e
−
θ
φ
(
y
)
d
y
)
{\displaystyle \mathbf {P} _{\theta }(A)=\left(\int _{A}e^{-\theta \varphi (x)}\,dx\right){\bigg /}\left(\int _{\mathbf {R} ^{d}}e^{-\theta \varphi (y)}\,dy\right)}
to give an asymptotic expression for the probability of some event A as θ becomes large. For example, if X is a standard normally distributed random variable on R , then
lim
ε
↓
0
ε
log
P
[
ε
X
∈
A
]
=
−
e
s
s
i
n
f
x
∈
A
x
2
2
{\displaystyle \lim _{\varepsilon \downarrow 0}\varepsilon \log \mathbf {P} {\big [}{\sqrt {\varepsilon }}X\in A{\big ]}=-\mathop {\mathrm {ess\,inf} } _{x\in A}{\frac {x^{2}}{2}}}
for every measurable set A .
Dembo, Amir; Zeitouni, Ofer (1998). Large deviations techniques and applications . Applications of Mathematics (New York) 38 (Second ed.). New York: Springer-Verlag. pp. xvi+396. ISBN 0-387-98406-2 . MR 1619036